1. The electric profiler is a stylus-type instrument: the stylus of the instrument hangs on the surface to be measured during measurement. The comparison method of the electric profiler is straight on the cross section in the direction of the processed texture, and the horizontal movement measurement is performed, and a measurement is directly obtained from the indicating instrument. Travel Ra value. This is a commonly used method for Ra value measurement. Or use the recording device of the instrument to draw an enlarged view of the roughness profile curve, and then calculate the Ra or Rz value. This kind of instrument is suitable for measuring room. But the portable electric profiler can be used on the production site.

 

2. Light section microscope measurement method: A light section microscope (double tube microscope) uses the principle of light section to measure surface roughness. Observe the surface roughness profile image from the eyepiece, and measure the Rz value and Ry value with a micrometer. The contour image can also be drawn by measurement, and then the Ra value can be calculated, which is not commonly used because of its complicated method. The roughness contour image can be photographed for evaluation when needed. The light section microscope is suitable for the measurement room.

 

3. Use a comparison microscope: observe the two by the microscope comparison method. The measured surface and the surface roughness comparison sample are close together, and the magnified surface is based on the roughness of the sample's working surface, and observe whether the measured surface is compared reach the surface roughness of the corresponding sample block; thus determine whether the measured surface roughness meets the requirements. This method cannot measure the roughness parameter value.

 

4. In the actual detection process of T-slot surface plates, the sample contrast method is a more commonly used interference microscope: it uses the principle of light wave interference to measure the surface of the T-slot plate based on the wavelength of light, and the roughness of the interference microscope is measured. If the measured surface has corresponding roughness, it will show uneven peak-valley interference fringes. Observe through eyepieces and measure the number of these interference fringes and the curvature of the peaks and valleys by using a micrometer to calculate the surface roughness. Ra value. If necessary, the peaks and valleys of interference fringes can be photographed for evaluation. The interference method is suitable for measuring the surface roughness of processing.

 

cast iron T-slot surface plate

 

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